Excerpt from "Inspection Technology" magazine

I have finished writing a manuscript due at the end of March.
I wrote a paper on the theme of "New Methods of Image Processing Inspection," but I was troubled by the following problems
(1) I couldn't write about the contents that seemed difficult because there was no exaggerated logic in FI itself.
(2) When I started writing about "features," there were too many and the focus would blur.
3) I can't show the images due to confidentiality.
This is the reason why we could not publish the images.
In the end, I decided to leave the manuscript at the very end of the deadline and said, "Oh well.
For those of you who have been reading this, there is nothing new here, but I am interested in what people who don't know about FI itself will feel when they read this.
Now, with that, we're ready to start preparing for the exhibition!

There are 2 comments on " Excerpts from "Inspection Technology" Journal ".

  1. collection in one volume From:.

    Has the "Inspection Technology" magazine, which contains the manuscript written by Ayaneko, been published? I would like to read it.

  2. yamada From:.

    It does not appear to have been published yet.
    I have been told it is the March or April issue, but have not been able to confirm.
    The content of the latest #FI catalog is based on this manuscript.

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